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Statistical
Process Control I (SPC I)
This course is a great place to learn about what really drives
product quality and how to monitor processes to pro-actively
drive quality improvement. Participants gain the fundamental
knowledge necessary to implement Statistical Process Control
and learn to avoid the common misapplications in practice.
Knowledge of basic algebra is recommended.
Seminar Content
Introduction to SPC
Reasons for Using SPC
Basic Graphical Methods
Quality Control versus Process Control
The Central Limit Theorem
Introduction to Nonnormal Data
The Central Limit Theorem
Conceptual Implementation of SPC
Monitoring Process Behavior
Xbar and R Chart Concepts
Sources of Variation
Common and Special Cause Sources
Detecting Special Cause Sources
Xbar and R Charts
Differences Between Measurements and Averages
Computing Control Limits and Charting
Chart Interpretation
Guidelines for Analysis of Charts
Basic Statistics
Population versus Sample
Estimation
Sampling
Random, Systematic and Rational Samples
Appropriate Sample Size
Process Capability
Stability and Capability
The Standard Normal
Capability Indices: Cpk and Cp; Ppk and Pp
Other Charts
X and MR Charts
p, c, np, and u Charts
Who Should Attend
Individuals who are involved in production or service processes
including management, engineering and quality; and have an
interest in using statistical techniques to monitor and control
their processes.
Prerequisites
Knowledge of basic
algebra is recommended.
Related Seminars
Statistical Process Control II
Design of Experiments I
Related Core Tools
Measurement System Assessment I
Seminar Fee: $1195
All meals, excluding dinner, are included.
Each participant will receive a comprehensive
manual and a Certificate of Completion at the close of the
seminar.
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